Pure and Applied Chemistry, 1982, Volume 54, No. 4, pp. 787-806

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Pure Appl. Chem., 1982, Vol. 54, No. 4, pp. 787-806

doi:10.1351/pac198254040787

Trace characterization of refractory metals by activation techniques

V. Krivan

Full text - pdf 541 kB

All articles from the International Symposium on Trace Analysis and Technological Development, Bombay, India, 16–19 February 1981.