Pure Appl. Chem., 1985, Vol. 57, No. 8, pp. 1133-1152
doi:10.1351/pac198557081133
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
General aspects of trace analytical methods: Part VI. Trace analysis of semiconductor materials - Part A: Bulk analysis
Yu. A. Zolotov and M. Grasserbauer