Pure Appl. Chem., 1985, Vol. 57, No. 8, pp. 1153-1170
doi:10.1351/pac198557081153
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
M. Grasserbauer, Yu. A. Zolotov and G. H. Morrison