Pure and Applied Chemistry, 2002, Volume 74, No. 3, pp. 419-422, Other PAC articles by these authors

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Pure Appl. Chem., 2002, Vol. 74, No. 3, pp. 419-422

http://dx.doi.org/10.1351/pac200274030419

Ion-induced damage and annealing of silicon. Molecular dynamics simulations

David Humbird and David B. Graves

University of California at Berkeley, Berkeley, CA 94720, USA

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