Pure and Applied Chemistry, Articles of John Ralston

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Articles by John Ralston

John Ralston, Ian Larson, Mark W. Rutland, Adam A. Feiler and Mieke Kleijn

Atomic force microscopy and direct surface force measurements (IUPAC Technical Report)

Vol. 77, Issue 12, p. 2149 [Details + Abstract] [Full text - pdf 510 kB]