| Number: | 540/21/98 |
|---|---|
| Start: | 01 January 1998 |
| End: | 31 December 2000 |
The use of optical analysis techniques for surface and materials analysis has recently experienced large growth, because of their ability to be used non destructively, to enable microanalysis, to avoid long sample preparation steps, and/or to multiplex analyses. Many competing methodologies make claims to establish superiority in a very competitive market place. A critical assessment of these methodologies according to established quality assurance standards will allow intelligent and accurate comparisons. This project will evaluate present techniques in the area of optical emission spectroscopy, laser ablation, and elemental analysis according to existing standards. Performance criteria of the analytical techniques will be defined.