Pure Appl. Chem., 1983, Vol. 55, No. 12, pp. 2023-2027
http://dx.doi.org/10.1351/pac198355122023
ANALYTICAL CHEMISTRY DIVISION
COMMISSION ON MICROCHEMICAL TECHNIQUES AND TRACE ANALYSIS
Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)
Individual author index pages
Other PAC articles by these authors
Solid state mass spectrometry for materials science
Preparation of biological samples for ion microscopy (Technical Report)
Critical evaluation of calibration procedures for distribution analysis of dopant elements in silicon and gallium arsenides
Distribution analysis of major and trace elements through semiconductor layers of changing matrix using secondary ion mass spectrometry (SIMS)
General aspects of trace analytical methods: Part VII. Trace analysis of semiconductor materials - Part B: Distribution analysis
General aspects of trace analytical methods: Part VI. Trace analysis of semiconductor materials - Part A: Bulk analysis
General aspects of trace analytical methods - V. Comparison of the abilities of trace analytical methods to determine small amounts or concentrations of elements
General aspects of trace analytical methods I. Methods of calibration in trace analysis